Site Lookup:
Government Agency Domains Select domain(s) that contain a specific agency name(s) in the URL
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Title: |
CTCMS | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170107192243/http://nist.gov/mml/ctcms |
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Live URL: |
http://nist.gov/mml/ctcms |
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Coverage: |
December 02, 2016 - January 07, 2017 |
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Description: |
Mission The Center's mission is to support the Material Measurement Laboratory's mission in materials measurement and data
delivery by: developing, solving, and quantifying materials models using state-of-the-art computational approaches; creating
opportunities for collaboration where CTCMS can make a positive difference by virtue of its structure, focus, and people;
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Title: |
Big Data Information | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170101013945/http://nist.gov/el/cyber-physical-systems/big-data-pwg |
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Live URL: |
http://nist.gov/el/cyber-physical-systems/big-data-pwg |
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Coverage: |
December 02, 2016 - January 01, 2017 |
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Description: |
The NIST Big Data Public Working Group web pages (NBD-PWG) are currently being renovated. In the meantime, the NIST Big Data
Interoperability Framework V1.0 documents are available at: Big Data Definitions: http://dx.doi.org/10.6028/NIST.SP.1500-1
Big Data Taxonomies: http://dx.doi.org/10.6028/NIST.SP.1500-2 Big Data Use Cases and Requirements:
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Title: |
Standards.gov | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170228063648/http://nist.gov/standardsgov |
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Live URL: |
http://nist.gov/standardsgov |
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Coverage: |
December 02, 2016 - February 28, 2017 |
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Description: |
Standards.gov is your pathway to standards solutions. The NIST Standards Coordination Office provides tools, programs, services,
and educational resources about documentary standards and conformity assessment.
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Title: |
SRD 134, Database of the Thermophysical Properties of Gases Used in the Semiconductor Industry | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170302022146/http://nist.gov/pml/div685/grp02/srd_134_gases_semiconductor |
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Live URL: |
http://nist.gov/pml/div685/grp02/srd_134_gases_semiconductor |
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Coverage: |
December 02, 2016 - March 02, 2017 |
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Description: |
The 1999 Semiconductor Industry Association (SIA) International Technology Roadmap for Semiconductors (ITRS) identifies "Equipment
Modeling" as first in a list of "Technology Requirements" and states that "the drivers for equipment modeling are equipment
design, process control, . . . " The ITRS indicates that continuing research is needed to obtain experimental data for "transport
and thermal constants." This Project will generate transport and thermodynamic property data for the gases used in semiconductor
processing. The data will be useful for equipment modeling in chemical vapor deposition (CVD) processes and the data will
also provide a rational basis for the calibration of mass flow controllers (MFCs) used to meter process gases. NIST is measuring
the thermophysical properties of the process gases, the "surrogate" gases, and binary mixtures of process and carrier gases.
The process gases are used in CVD and the surrogate gases are used to calibrate MFCs. The results will be disseminated in
this data base providing the heat capacity, thermal conductivity, viscosity, and the virial coefficients for the virial equation
of state providing the pressure-density-temperature relation for the process gases. Index of Semiconductor Process Gases References:
"JANAF Thermochemical Tables", J.Phys. Chem. Ref. Data (1978, 7, 793. 1978 Supplement) Horvath, A.L., "Physical Properties
of Inorganic Compounds," Crane Russak, New York, 1975 IUPAC, "Atomic Weights of the Elements 1993," J. Phys. Chem. Ref. Data
(1995, 24, 1561) Verdelli, L.S., Miller, H.C., Gall, J.F., "Some Physical Properties of Sulfur Hexafluoride," Ind. Eng. Chem.
(1951, 43, 1126). Hurly, J.J., Defibaugh, D.R., and Moldover, M.R., "Thermodynamic Properties of Sulfur Hexafluoride," Int.
J. Thermophysics v21, 739 (2000).
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Title: |
Information Technology Laboratory | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170301184924/http://nist.gov/itl |
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Live URL: |
http://nist.gov/itl |
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Coverage: |
November 04, 2016 - March 01, 2017 |
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Description: |
As one of the major research components of the National Institute of Standards and Technology, the Information Technology
Laboratory (ITL) has the broad mission to promote U.S. innovation and industrial competitiveness by advancing measurement
science, standards, and technology through research and development in information technology, mathematics, and statistics.
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Title: |
Time and Frequency Division | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170301202150/http://nist.gov/pml/time-and-frequency-division |
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Live URL: |
http://nist.gov/pml/time-and-frequency-division |
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Coverage: |
December 02, 2016 - March 01, 2017 |
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Description: |
The Time and Frequency Division maintains the standard for frequency and time interval for the United States, provides official
time to the United States, and carries out a broad program of research and service activities in time and frequency metrology.
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Title: |
msed | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20161230121615/http://nist.gov/mml/msed/ |
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Live URL: |
http://nist.gov/mml/msed/ |
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Coverage: |
December 02, 2016 - December 30, 2016 |
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Title: |
Voting | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170107191630/http://nist.gov/itl/voting |
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Live URL: |
http://nist.gov/itl/voting |
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Coverage: |
December 02, 2016 - January 07, 2017 |
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Description: |
The 2002 Help America Vote Act has given NIST a key role in helping to realize nationwide improvements in voting systems.
To assist the Election Assistance Commission with the development of voluntary voting system guidelines, HAVA established
the Technical Guidelines Development Committee (TGDC) and directs NIST to chair the TGDC.
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Title: |
Face Projects | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20170101014322/http://nist.gov/itl/iad/ig/face |
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Live URL: |
http://nist.gov/itl/iad/ig/face |
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Coverage: |
December 02, 2016 - January 01, 2017 |
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Description: |
Face Challenges NIST is pleased to announce new open and sequestered challenge datasets, including detection and recognition
of individuals in social media. These challenges are available here. Results will be added as they are submitted to NIST.
Face in Video Evaluation (FIVE) NIST is pleased to announce the FIVE program dedicated to development of face recognition
in
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Title: |
NIST Randomness Beacon | NIST
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Archival URL:
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http://eot.us.archive.org/eot/20161215192602/http://nist.gov/itl/csd/ct/nist_beacon.cfm |
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Live URL: |
http://nist.gov/itl/csd/ct/nist_beacon.cfm |
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Coverage: |
December 02, 2016 - December 15, 2016 |
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Description: |
The Beacon broadcasts full-entropy bit-strings in blocks of 512 bits every 60 seconds. Each such value is time-stamped and
signed, and includes the hash of the previous value to chain the sequence of values together. This prevents all, even the
source, from retroactively changing an output packet without being detected. The beacon keeps all output packets and makes
them
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